ANF Event Details:
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ISO Nanotechnology Symposium
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Location:
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Breakthrough & Discovery Theatrettes, Level 4, Matrix at Biopolis, Singapore
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From: 2007/12/03 To: 2007/12/03
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Introduction:
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THe ISO Nanotech Symposium will be held on 3rd Dec 2007 co-currently with the ISO/TC 229 & IEC/TC 113 meetings during 3rd-7th Dec 2007. The event will be organized by SPRING in partnership with A*STAR and EDB.
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Program:
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Experts from leading metrology institutes, international standardisation bodies and industry leaders in nanotechnology will share with the audience the up-to-date information on the trend of world nanotechnology market, advances in nanotechnology and nanometrology worldwide and current efforts on standardisation by ISO, IEC and IEEE. Impact of nanotechnology products such as nanoparticiles on environment, human health and safety will also be addressed.
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Summary:
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Nanotechnology is a new enabling technology widely regarded as a key economic driver for the 21st century. It provides a platform for developing smaller, faster, cheaper and more robust products that have new and far greater functionalities with a wide array of potential applications.
It is well known that a good metrology system provides the basis for accurate and traceable measurements which are critical to the development of reliable products. Nanotechnology is no exception. In the manufacture of nano-products, nanometrology standards and certified reference materials are needed to ensure that reliable measurement can be carried out at nano-scale level with atomic precision.
The successful transition of nano-products from laboratories to the marketplace requires standardisation. Increasingly, customers of nano-products demand testing to be conducted according to internationally agreed methods using measuring instruments properly calibrated to enable them to compare the performance of the products with the claimed specifications. Concerns over the impact of nano-products, such as nano-particles and nano-materials, on health, safety and environment (EHS) also need to be addressed.
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